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3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise excellent noise resistance

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise excellent noise resistanceC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

SKU: 54874758600 · From condeoeiras.edu.pt

4.8
USD10375.00 USD10402.00

Pay in 4 interest-free payments of $2593.75 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 6 - Aug 11

Description

excellent noise resistance

guaranteeing the accuracy and reliability needed for industry compliance

Optional power supply available for use with oscilloscopes that do not provide probe power

such as that of a copper wire

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3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise excellent noise resistanceC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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